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Organic transistor technology options for device performance versus technology options for increased circuit reliability and yield on foil

dc.contributor.authorGenoe, Jan
dc.contributor.authorMyny, Kris
dc.contributor.authorSteudel, Soeren
dc.contributor.authorSmout, Steve
dc.contributor.authorVicca, Peter
dc.contributor.authorvan der Putten, Bas
dc.contributor.authorTripathi, Ashutosh
dc.contributor.authorvan Aerle, Nick
dc.contributor.authorGelinck, Gerwin
dc.contributor.authorDehaene, Wim
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-18T16:30:09Z
dc.date.available2021-10-18T16:30:09Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17137
dc.sourceIIOimport
dc.titleOrganic transistor technology options for device performance versus technology options for increased circuit reliability and yield on foil
dc.typeProceedings paper
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorMyny, Kris
dc.contributor.imecauthorSmout, Steve
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecMyny, Kris::0000-0002-5230-495X
dc.contributor.orcidimecSmout, Steve::0000-0001-5464-8951
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpage171
dc.source.endpage174
dc.source.conference68th Annual Device Research Conference
dc.source.conferencedate21/06/2010
dc.source.conferencelocationSouth Bend, IN USA
imec.availabilityPublished - imec


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