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dc.contributor.authorGhiass, Mohammad Adel
dc.contributor.authorArmini, Silvia
dc.contributor.authorCarli, Marta
dc.contributor.authorMaestre Caro, Arantxa
dc.contributor.authorCherman, Vladimir
dc.contributor.authorOgi, Jun
dc.contributor.authorOda, Shunri
dc.contributor.authorMoktadir, Zakaria
dc.contributor.authorTsuchiya, Joshinage
dc.contributor.authorMizuta, Hiroshi
dc.date.accessioned2021-10-18T16:32:10Z
dc.date.available2021-10-18T16:32:10Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17144
dc.sourceIIOimport
dc.titleTemperature insensitive conductance detection with surface-functionalized silicon nanowire sensors
dc.typeMeeting abstract
dc.contributor.imecauthorArmini, Silvia
dc.contributor.imecauthorCherman, Vladimir
dc.contributor.orcidimecArmini, Silvia::0000-0003-0578-3422
dc.source.peerreviewno
dc.source.conference36th International Conference on Micro & Nano Engineering - MNE
dc.source.conferencedate19/09/2010
dc.source.conferencelocationGenova Italy
imec.availabilityPublished - imec


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