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Recent advances in understanding the bias temperature instability

dc.contributor.authorGrasser, Tibor
dc.contributor.authorKaczer, Ben
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorReisinger, Hans
dc.contributor.authorAichinger, Thomas
dc.contributor.authorHehenberger, Phillip
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorNelhiebel, M
dc.date.accessioned2021-10-18T16:42:46Z
dc.date.available2021-10-18T16:42:46Z
dc.date.issued2010-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17184
dc.sourceIIOimport
dc.titleRecent advances in understanding the bias temperature instability
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate6/12/2010
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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