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The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability

dc.contributor.authorGrasser, Tibor
dc.contributor.authorReisinger, Hans
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-18T16:43:16Z
dc.date.available2021-10-18T16:43:16Z
dc.date.issued2010-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17186
dc.sourceIIOimport
dc.titleThe time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage16
dc.source.endpage25
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/05/2010
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5488859
imec.availabilityPublished - open access


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