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Trends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorMartens, Koen
dc.date.accessioned2021-10-18T16:44:55Z
dc.date.available2021-10-18T16:44:55Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17192
dc.sourceIIOimport
dc.titleTrends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorMartens, Koen
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage64
dc.source.endpage72
dc.source.conference40th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate14/09/2010
dc.source.conferencelocationSevilla Spain
imec.availabilityPublished - open access


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