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Diamond tip based automated two-point electrical probing on the nanoscale

dc.contributor.authorHantschel, Thomas
dc.contributor.authorArstila, Kai
dc.contributor.authorOlanterae, Lauri
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-18T16:52:05Z
dc.date.available2021-10-18T16:52:05Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17219
dc.sourceIIOimport
dc.titleDiamond tip based automated two-point electrical probing on the nanoscale
dc.typeOral presentation
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.conferenceDiamond 2010: 21st European Conference on Diamond, Diamond- Like Materials, Carbon Nanotubes, and Nitrides
dc.source.conferencedate5/09/2010
dc.source.conferencelocationBudapest Hungary
imec.availabilityPublished - imec


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