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Characterization of boron-doped diamond films for application in nanoscale electrical measurements

dc.contributor.authorHantschel, Thomas
dc.contributor.authorZimmer, Jerry
dc.contributor.authorMoussa, Alain
dc.contributor.authorOlanterae, Lauri
dc.contributor.authorClemente, Francesca
dc.contributor.authorGeypen, Jef
dc.contributor.authorBender, Hugo
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-18T16:52:52Z
dc.date.available2021-10-18T16:52:52Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17222
dc.sourceIIOimport
dc.titleCharacterization of boron-doped diamond films for application in nanoscale electrical measurements
dc.typeProceedings paper
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorMoussa, Alain
dc.contributor.imecauthorGeypen, Jef
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.conferenceHasselt Diamond Workshop - SBDD XV
dc.source.conferencedate22/02/2010
dc.source.conferencelocationHasselt Belgium
imec.availabilityPublished - imec


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