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Influence of interface traps on high-mobility channel performance

dc.contributor.authorHellings, Geert
dc.contributor.authorEneman, Geert
dc.contributor.authorBrammertz, Guy
dc.contributor.authorMartens, Koen
dc.contributor.authorMitard, Jerome
dc.contributor.authorWang, Wei-E
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorMeuris, Marc
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-18T16:58:53Z
dc.date.available2021-10-18T16:58:53Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17243
dc.sourceIIOimport
dc.titleInfluence of interface traps on high-mobility channel performance
dc.typeProceedings paper
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conferenceSilicon Nanoelectronics Workshop
dc.source.conferencedate13/06/2010
dc.source.conferencelocationHonolulu, HI USA
imec.availabilityPublished - imec


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