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FinFETs and their futures

dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorParvais, Bertrand
dc.contributor.authorChiarella, Thomas
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVeloso, Anabela
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVerheyen, Peter
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorBrus, Stephan
dc.contributor.authorZschaetzsch, Gerd
dc.contributor.authorErcken, Monique
dc.contributor.authorAltamirano Sanchez, Efrain
dc.contributor.authorLocorotondo, Sabrina
dc.contributor.authorDemand, Marc
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorBiesemans, Serge
dc.date.accessioned2021-10-18T17:09:36Z
dc.date.available2021-10-18T17:09:36Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17277
dc.sourceIIOimport
dc.titleFinFETs and their futures
dc.typeProceedings paper
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorBrus, Stephan
dc.contributor.imecauthorErcken, Monique
dc.contributor.imecauthorAltamirano Sanchez, Efrain
dc.contributor.imecauthorLocorotondo, Sabrina
dc.contributor.imecauthorDemand, Marc
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference6th International SemOI Conference "Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices"
dc.source.conferencedate26/04/2010
dc.source.conferencelocationKiev Ukraine
imec.availabilityPublished - open access


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