dc.contributor.author | Idemoto, T. | |
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Tsunoda, I. | |
dc.contributor.author | Yoneoka, M. | |
dc.contributor.author | Nakashima, T. | |
dc.contributor.author | Bargallo Gonzalez, Mireia | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-18T17:17:23Z | |
dc.date.available | 2021-10-18T17:17:23Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17302 | |
dc.source | IIOimport | |
dc.title | Carrier lifetime evaluation of electron irradiated SiGe/Si diode | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 154 | |
dc.source.endpage | 155 | |
dc.source.conference | 2nd Semiconductor Materials and Devices Forum - SMDF-2 | |
dc.source.conferencedate | 11/12/2010 | |
dc.source.conferencelocation | Kumamoto Japan | |
imec.availability | Published - open access | |