dc.contributor.author | Jonckheere, Rik | |
dc.contributor.author | Van Den Heuvel, Dieter | |
dc.contributor.author | Lamantia, Matthew | |
dc.contributor.author | Baudemprez, Bart | |
dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Ronse, Kurt | |
dc.date.accessioned | 2021-10-18T17:24:44Z | |
dc.date.available | 2021-10-18T17:24:44Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17326 | |
dc.source | IIOimport | |
dc.title | EUV mask defectivity: status and mitigation towards HVM | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.imecauthor | Van Den Heuvel, Dieter | |
dc.contributor.imecauthor | Baudemprez, Bart | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | International Symposium on Extreme Ultraviolet Lithography | |
dc.source.conferencedate | 17/10/2010 | |
dc.source.conferencelocation | Kobe Japan | |
imec.availability | Published - open access | |
imec.internalnotes | e-proceedings Sematech-website | |