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Recent trends in bias temperature instability

dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCho, Moon Ju
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T17:27:22Z
dc.date.available2021-10-18T17:27:22Z
dc.date.issued2010-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17335
dc.sourceIIOimport
dc.titleRecent trends in bias temperature instability
dc.typeMeeting abstract
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.conference16th Workshop on Dielectrics in Microelectronics - WoDIM
dc.source.conferencedate28/06/2010
dc.source.conferencelocationBratislava Slovakia
imec.availabilityPublished - imec


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