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Origin of NBTI variability in deeply scaled pFETs

dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorFranco, Jacopo
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorReisinger, Hans
dc.date.accessioned2021-10-18T17:27:43Z
dc.date.available2021-10-18T17:27:43Z
dc.date.issued2010-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17336
dc.sourceIIOimport
dc.titleOrigin of NBTI variability in deeply scaled pFETs
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage26
dc.source.endpage32
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/05/2010
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5488856
imec.availabilityPublished - open access


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