dc.contributor.author | Ke, Xiaoxing | |
dc.contributor.author | Bals, Sarah | |
dc.contributor.author | Cott, Daire | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Van Tendeloo, Gustaaf | |
dc.date.accessioned | 2021-10-18T17:34:21Z | |
dc.date.available | 2021-10-18T17:34:21Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 1431-9276 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17357 | |
dc.source | IIOimport | |
dc.title | 3D analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artefacts | |
dc.type | Journal article | |
dc.contributor.imecauthor | Cott, Daire | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 210 | |
dc.source.endpage | 217 | |
dc.source.journal | Microscopy and Microanalysis | |
dc.source.volume | 16 | |
imec.availability | Published - imec | |