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High-energy neutrons effect on strained and non-strained SOI MuGFETs

dc.contributor.authorKilchytska, Valeria
dc.contributor.authorAlvarado, J.
dc.contributor.authorPut, Sofie
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMilitaru, O.
dc.contributor.authorBerger, G.
dc.contributor.authorFlandre, Denis
dc.date.accessioned2021-10-18T17:38:21Z
dc.date.available2021-10-18T17:38:21Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17370
dc.sourceIIOimport
dc.titleHigh-energy neutrons effect on strained and non-strained SOI MuGFETs
dc.typeOral presentation
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF
dc.source.conferencedate11/10/2010
dc.source.conferencelocationItaly
imec.availabilityPublished - imec


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