Authors

Kobayashi, Daisuke; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; Hirose, Kazuyuki; Claeys, Cor

Conference

11th European Conference on Radiation and its Effects on Components and Systems - RADECS

Title

Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates

Publication type

Proceedings paper

Embargo date

9999-12-31