dc.contributor.author | Lawrie, Kirsten | |
dc.contributor.author | Blakey, Idriss | |
dc.contributor.author | Blinco, James | |
dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Jack, Kevin | |
dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Leeson, Michael | |
dc.contributor.author | Younkin, Todd | |
dc.contributor.author | Whittaker, Andrew | |
dc.date.accessioned | 2021-10-18T18:04:21Z | |
dc.date.available | 2021-10-18T18:04:21Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17452 | |
dc.source | IIOimport | |
dc.title | Poly(olefin sulfone)s - A materials platform for studying resist derived contamination | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | International Symposium on Extreme Ultraviolet Lithography | |
dc.source.conferencedate | 18/10/2010 | |
dc.source.conferencelocation | Kobe Japan | |
imec.availability | Published - open access | |
imec.internalnotes | e-proceedings Sematech website | |