dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Heylen, Nancy | |
dc.contributor.author | Daviot, Jerome | |
dc.contributor.author | Reid, Chris | |
dc.contributor.author | Leunissen, Peter | |
dc.date.accessioned | 2021-10-18T18:16:28Z | |
dc.date.available | 2021-10-18T18:16:28Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17489 | |
dc.source | IIOimport | |
dc.title | Electrochemical, physical, and electrical characterization of two clean solutions for Cu PCMP clean | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Heylen, Nancy | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 64 | |
dc.source.endpage | 65 | |
dc.source.conference | 10th International Symposium on Ultra-Clean Processing of Semiconductor Devices - UCPSS | |
dc.source.conferencedate | 19/09/2010 | |
dc.source.conferencelocation | Oostende Belgium | |
imec.availability | Published - open access | |