dc.contributor.author | Loozen, Xavier | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Rothschild, Aude | |
dc.contributor.author | Vermang, Bart | |
dc.contributor.author | John, Joachim | |
dc.contributor.author | Gordon, Ivan | |
dc.date.accessioned | 2021-10-18T18:31:03Z | |
dc.date.available | 2021-10-18T18:31:03Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 1862-6254 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17530 | |
dc.source | IIOimport | |
dc.title | On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells | |
dc.type | Journal article | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Vermang, Bart | |
dc.contributor.imecauthor | John, Joachim | |
dc.contributor.imecauthor | Gordon, Ivan | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Vermang, Bart::0000-0003-2669-2087 | |
dc.contributor.orcidimec | Gordon, Ivan::0000-0002-0713-8403 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 362 | |
dc.source.endpage | 364 | |
dc.source.journal | Physica Status Solidi. Rapid Research Letters | |
dc.source.issue | 12 | |
dc.source.volume | 4 | |
dc.identifier.url | DOI 10.1002/pssr.201004361 | |
imec.availability | Published - imec | |