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On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells

dc.contributor.authorLoozen, Xavier
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorRothschild, Aude
dc.contributor.authorVermang, Bart
dc.contributor.authorJohn, Joachim
dc.contributor.authorGordon, Ivan
dc.date.accessioned2021-10-18T18:31:03Z
dc.date.available2021-10-18T18:31:03Z
dc.date.issued2010
dc.identifier.issn1862-6254
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17530
dc.sourceIIOimport
dc.titleOn the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells
dc.typeJournal article
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorVermang, Bart
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorGordon, Ivan
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.source.peerreviewyes
dc.source.beginpage362
dc.source.endpage364
dc.source.journalPhysica Status Solidi. Rapid Research Letters
dc.source.issue12
dc.source.volume4
dc.identifier.urlDOI 10.1002/pssr.201004361
imec.availabilityPublished - imec


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