Authors

Loozen, Xavier; O'Sullivan, Barry; Rothschild, Aude; Vermang, Bart; John, Joachim; Gordon, Ivan

ISSN

1862-6254

Issue

12

Journal

Physica Status Solidi. Rapid Research Letters

Volume

4

Title

On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells

Publication type

Journal article