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On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells
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On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Loozen, Xavier
;
O'Sullivan, Barry
;
Rothschild, Aude
;
Vermang, Bart
;
John, Joachim
;
Gordon, Ivan
Journal
Physica Status Solidi. Rapid Research Letters
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1818
since deposited on 2021-10-18
Acq. date: 2025-12-17
Citations
Metrics
Views
1818
since deposited on 2021-10-18
Acq. date: 2025-12-17
Citations