On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells

dc.contributor.author	Loozen, Xavier
dc.contributor.author	O'Sullivan, Barry
dc.contributor.author	Rothschild, Aude
dc.contributor.author	Vermang, Bart
dc.contributor.author	John, Joachim
dc.contributor.author	Gordon, Ivan
dc.contributor.imecauthor	O'Sullivan, Barry
dc.contributor.imecauthor	Vermang, Bart
dc.contributor.imecauthor	John, Joachim
dc.contributor.imecauthor	Gordon, Ivan
dc.contributor.orcidimec	O'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimec	Vermang, Bart::0000-0003-2669-2087
dc.contributor.orcidimec	Gordon, Ivan::0000-0002-0713-8403
dc.date.accessioned	2021-10-18T18:31:03Z
dc.date.available	2021-10-18T18:31:03Z
dc.date.issued	2010
dc.identifier.issn	1862-6254
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/17530
dc.identifier.url	DOI 10.1002/pssr.201004361
dc.source.beginpage	362
dc.source.endpage	364
dc.source.issue	12
dc.source.journal	Physica Status Solidi. Rapid Research Letters
dc.source.volume	4
dc.title	On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells
dc.type	Journal article
dspace.entity.type	Publication
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