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Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions
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Authors
Luque Rodriguez, A.
;
Jimenez Tejada, J.A.
;
Rodriguez-Bolivar, S.
;
Bargallo Gonzalez, Mireia
;
Eneman, Geert
;
Claeys, Cor
;
Simoen, Eddy
Conference
40th European Solid-State Device Research Conference - ESSDERC
Title
Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions
Publication type
Proceedings paper
Embargo date
9999-12-31
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