dc.contributor.author | Marchal, Pol | |
dc.contributor.author | Van der Plas, Geert | |
dc.contributor.author | Limaye, Paresh | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Cherman, Vladimir | |
dc.contributor.author | Oprins, Herman | |
dc.contributor.author | Labie, Riet | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-18T18:45:27Z | |
dc.date.available | 2021-10-18T18:45:27Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17570 | |
dc.source | IIOimport | |
dc.title | Verifying thermal/thermo-mechanical behavior of a 3D stack – challenges and solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van der Plas, Geert | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Cherman, Vladimir | |
dc.contributor.imecauthor | Oprins, Herman | |
dc.contributor.imecauthor | Labie, Riet | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Oprins, Herman::0000-0003-0680-4969 | |
dc.contributor.orcidimec | Labie, Riet::0000-0002-1401-1291 | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.contributor.orcidimec | Cherman, Vladimir::0000-0002-8068-9236 | |
dc.source.peerreview | no | |
dc.source.beginpage | 15 | |
dc.source.endpage | 16 | |
dc.source.conference | International Symposium on VLSI Design Automation and Test - VLSI-DAT | |
dc.source.conferencedate | 26/04/2010 | |
dc.source.conferencelocation | Hsinchu Taiwan | |
imec.availability | Published - imec | |