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Conference contributions
Challenges and emerging solutions for testing TSV-based 3D stacked ICs
Publication:
Challenges and emerging solutions for testing TSV-based 3D stacked ICs
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Date
2010-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
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Abstract
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1837
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Acq. date: 2026-02-27
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Statistics
Views
1837
since deposited on 2021-10-18
3
last month
Acq. date: 2026-02-27
Citations