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dc.contributor.authorMeersschaut, Johan
dc.contributor.authorToeller, Michael
dc.contributor.authorSchaekers, Marc
dc.contributor.authorWang, Xin Peng
dc.contributor.authorBrijs, Bert
dc.contributor.authorWouters, Dirk
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAltimime, Laith
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorVancoille, Eric
dc.date.accessioned2021-10-18T19:01:24Z
dc.date.available2021-10-18T19:01:24Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17613
dc.sourceIIOimport
dc.titleMetal-organic chemical vapor deposition of Ti-doped NiO layers for application in resistive switching memories
dc.typeProceedings paper
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorVancoille, Eric
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.source.peerreviewyes
dc.source.beginpage313
dc.source.endpage322
dc.source.conferencePhysics and Technology of High-k Materials 8
dc.source.conferencedate10/10/2010
dc.source.conferencelocationLas Vegas, NV USA
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 33, Iss. 3


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