dc.contributor.author | Melczarsky, Martin | |
dc.contributor.author | Gallego Garcia, German | |
dc.contributor.author | Posthuma, Niels | |
dc.contributor.author | Van Kerschaver, Emmanuel | |
dc.contributor.author | Beaucarne, Guy | |
dc.date.accessioned | 2021-10-18T19:02:26Z | |
dc.date.available | 2021-10-18T19:02:26Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17616 | |
dc.source | IIOimport | |
dc.title | Contact resistance measurement techniques for Ag thick-film screen-printed contacts to solar cells | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Posthuma, Niels | |
dc.contributor.orcidimec | Posthuma, Niels::0000-0002-6029-1909 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 960 | |
dc.source.endpage | 963 | |
dc.source.conference | IEEE 34rd Photovoltaic Specialists Conference | |
dc.source.conferencedate | 7/06/2009 | |
dc.source.conferencelocation | Philadelphia, PA USA | |
imec.availability | Published - open access | |