dc.contributor.author | Menou, Nicolas | |
dc.contributor.author | Popovici, Mihaela Ioana | |
dc.contributor.author | Opsomer, Karl | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Pawlak, Malgorzata | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Franquet, Alexis | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Detavernier, Christophe | |
dc.contributor.author | Van Elshocht, Sven | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Biesemans, Serge | |
dc.contributor.author | Kittl, Jorge | |
dc.date.accessioned | 2021-10-18T19:03:15Z | |
dc.date.available | 2021-10-18T19:03:15Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0021-4922 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17618 | |
dc.source | IIOimport | |
dc.title | Seed layer and multistack approaches to reduce leakage in SrTiO3-based metal-insulator-metal capacitors using TiN bottom electrode | |
dc.type | Journal article | |
dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
dc.contributor.imecauthor | Opsomer, Karl | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Franquet, Alexis | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 04DD01 | |
dc.source.journal | Japanese Journal of Applied Physics | |
dc.source.issue | 4 | |
dc.source.volume | 49 | |
imec.availability | Published - open access | |