Authors

Mitard, Jerome; Vincent, Benjamin; De Jaeger, Brice; Martens, Koen; Krom, Raymond; Loo, Roger; Eneman, Geert; De Meyer, Kristin; Meuris, Marc; Heyns, Marc; Vandervorst, Wilfried; Caymax, Matty; Hoffmann, Thomas Y.

Conference

217th Electrochemical Society Meeting

Title

Electrical characterization of Si capped Hf)2/metal gate Ge-pFETs: physical insight into critical parameters

Publication type

Meeting abstract