Texture of atomic layer deposited ruthenium
dc.contributor.author | Musschoot, J. | |
dc.contributor.author | Xie, Q. | |
dc.contributor.author | Deduytsche, D. | |
dc.contributor.author | De Keyser, K. | |
dc.contributor.author | Longrie, D. | |
dc.contributor.author | Haemers, J. | |
dc.contributor.author | Van den Berghe, S. | |
dc.contributor.author | Van Meirhaeghe, R.L. | |
dc.contributor.author | D'Haen, Jan | |
dc.contributor.author | Detavernier, C. | |
dc.date.accessioned | 2021-10-18T19:22:50Z | |
dc.date.available | 2021-10-18T19:22:50Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0167-9317 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17666 | |
dc.source | IIOimport | |
dc.title | Texture of atomic layer deposited ruthenium | |
dc.type | Journal article | |
dc.contributor.imecauthor | D'Haen, Jan | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1879 | |
dc.source.endpage | 1883 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 10 | |
dc.source.volume | 87 | |
imec.availability | Published - open access |