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Robust digital design in organic electronics by dual-gate technology

dc.contributor.authorMyny, Kris
dc.contributor.authorBeenhakkers, Monique J.
dc.contributor.authorvan Aerle, Nick A.J.M.
dc.contributor.authorGelinck, Gerwin H.
dc.contributor.authorGenoe, Jan
dc.contributor.authorDehaene, Wim
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-18T19:23:33Z
dc.date.available2021-10-18T19:23:33Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17668
dc.sourceIIOimport
dc.titleRobust digital design in organic electronics by dual-gate technology
dc.typeProceedings paper
dc.contributor.imecauthorMyny, Kris
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecMyny, Kris::0000-0002-5230-495X
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewyes
dc.source.beginpage140
dc.source.endpage141
dc.source.conferenceIEEE International Solid-State Circuits Conference - ISSCC
dc.source.conferencedate7/02/2010
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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