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Noise as a spectroscopic tool for semiconductor characterization
Publication:
Noise as a spectroscopic tool for semiconductor characterization
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Date
1997
Proceedings Paper
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1740.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
Journal
Abstract
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1864
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Acq. date: 2025-12-16
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Metrics
Views
1864
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-16
Citations