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Nanoprober as a tool for electrical measurements of nanostructures

dc.contributor.authorOlanterae, Lauri
dc.contributor.authorArstila, Kai
dc.contributor.authorHantschel, Thomas
dc.contributor.authorPalanne, Saku
dc.contributor.authorSajavaara, Timo
dc.date.accessioned2021-10-18T19:49:09Z
dc.date.available2021-10-18T19:49:09Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17731
dc.sourceIIOimport
dc.titleNanoprober as a tool for electrical measurements of nanostructures
dc.typeOral presentation
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.conferencePhysics Days, the 44th Annual Meeting of the Finnish Physical Society
dc.source.conferencedate11/03/2010
dc.source.conferencelocationJyväskylä Finland
imec.availabilityPublished - imec


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