dc.contributor.author | Ronse, Kurt | |
dc.date.accessioned | 2021-10-18T20:58:30Z | |
dc.date.available | 2021-10-18T20:58:30Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17903 | |
dc.source | IIOimport | |
dc.title | E-beam mask-less lithography : prospects and challenges | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.source.peerreview | no | |
dc.source.beginpage | 76370A | |
dc.source.conference | Alternative Lithographic Technologies II | |
dc.source.conferencedate | 21/02/2010 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 7637 | |