Authors

Ruiz Aguado, Daniel; Govoreanu, Bogdan; Zhang, W.D.; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan

ISSN

0018-9383

Issue

10

Journal

IEEE Transactions on Electron Devices

Volume

57

Title

A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique

Publication type

Journal article

Embargo date

9999-12-31