dc.contributor.author | Sangameswaran, Sandeep | |
dc.contributor.author | De Coster, Jeroen | |
dc.contributor.author | Witvrouw, Ann | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2021-10-18T21:13:22Z | |
dc.date.available | 2021-10-18T21:13:22Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17938 | |
dc.source | IIOimport | |
dc.title | Robustness levels of MEMS to electrostatic discharge (ESD) stress - guidelines for protection | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | De Coster, Jeroen | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.source.peerreview | no | |
dc.source.conference | Prof. ir. R. VanCouterenleerstoel K.U. Leuven | |
dc.source.conferencedate | 24/11/2010 | |
dc.source.conferencelocation | Heverlee Belgium | |
imec.availability | Published - imec | |