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Statistical approach in a system level methodology to deal with process variation

dc.contributor.authorSanz Pineda, C.
dc.contributor.authorPrieto, M.
dc.contributor.authorGomez, I.
dc.contributor.authorTenllado, C.
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-18T21:15:37Z
dc.date.available2021-10-18T21:15:37Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17943
dc.sourceIIOimport
dc.titleStatistical approach in a system level methodology to deal with process variation
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewno
dc.source.beginpage115
dc.source.endpage124
dc.source.conference8th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and Synthesis - CODES-ISSS
dc.source.conferencedate1/10/2010
dc.source.conferencelocationScottsdale, AZ USA
imec.availabilityPublished - imec


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