Publication:

Quantification of B and As depth profiles with resonant post-ionisation mass spectrometry

Date

1997

Proceedings Paper

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Files

1766.pdf 201.1 KB

Author(s)

De Bisschop, Peter

;

Gomez, Jose Ignacio

;

Vandervorst, Wilfried

Statistics

1987 since deposited on 2021-09-30

Acq. date: 2026-05-02