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Conference contributions
High-temperature reliability behavior of SSI-flash EEPROM devices
Publication:
High-temperature reliability behavior of SSI-flash EEPROM devices
Date
1997
Proceedings Paper
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1768.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Wellekens, Dirk
;
Groeseneken, Guido
;
Haspeslagh, Luc
;
Van Houdt, Jan
;
Deferm, Ludo
;
Maes, Herman
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1943
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1943
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations