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Low-frequency noise analysis of g-irradiated p-channel bulk MuGFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorPut, Sofie
dc.contributor.authorLeroux, P.
dc.contributor.authorVan Uffelen, M.
dc.contributor.authorJurczak, Gosia
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-18T21:37:58Z
dc.date.available2021-10-18T21:37:58Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17993
dc.sourceIIOimport
dc.titleLow-frequency noise analysis of g-irradiated p-channel bulk MuGFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage25
dc.source.endpage28
dc.source.conference11th International Conference on Ultimate Integration on Silicon - ULIS
dc.source.conferencedate18/03/2010
dc.source.conferencelocationGlasgow UK
imec.availabilityPublished - open access


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