Publication:
Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
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2026 since deposited on 2021-09-29
4last month
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Acq. date: 2026-04-27
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Statistics
Views
2026 since deposited on 2021-09-29
4last month
1last week
Acq. date: 2026-04-27
Citations