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Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
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Understanding of the hot-carrier degradation in submicron MOSFET's : from uniform injection towards the real operating conditions
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Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Bellens, Rudi
;
Van den Bosch, Geert
;
Maes, Herman
Journal
Abstract
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Acq. date: 2025-12-16
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Views
2022
since deposited on 2021-09-29
1
last month
1
last week
Acq. date: 2025-12-16
Citations