Publication:

Methodology for design optimization of SOI FinFET grounded-gate NMOS devices

Date

2010

Journal article

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Files

20492.pdf 565.55 KB

Author(s)

;

Russ, Christian

;

Tremouilles, David

;

Griffoni, Alessio

;

Linten, Dimitri

;

;

Collaert, Nadine

;

Rooyackers, Rita

;

;

Groeseneken, Guido

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1896 since deposited on 2021-10-18

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Acq. date: 2025-12-10