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dc.contributor.authorThijs, Steven
dc.contributor.authorScholz, Mirko
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorRuss, Christian
dc.contributor.authorStadler, Wolfgang
dc.contributor.authorLafonteese, David
dc.contributor.authorVashchenko, Vladislav
dc.contributor.authorSawada, Masanori
dc.contributor.authorConcannon, Ann
dc.contributor.authorHopper, Peter
dc.contributor.authorJansen, Philippe
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T22:19:10Z
dc.date.available2021-10-18T22:19:10Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18083
dc.sourceIIOimport
dc.titleSCCF - System to component level correlation factor
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage157
dc.source.endpage166
dc.source.conference32nd Annual EOS/ESD Symposium
dc.source.conferencedate3/10/2010
dc.source.conferencelocationReno, NV USA
imec.availabilityPublished - open access


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