dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Russ, Christian | |
dc.contributor.author | Stadler, Wolfgang | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T22:19:37Z | |
dc.date.available | 2021-10-18T22:19:37Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18084 | |
dc.source | IIOimport | |
dc.title | System to component level correlation factor | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | International ESD Workshop - IEW | |
dc.source.conferencedate | 10/05/2010 | |
dc.source.conferencelocation | Tutzing Germany | |
imec.availability | Published - open access | |