Show simple item record

Evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy

dc.contributor.authorTsunoda, I.
dc.contributor.authorNaka, N.
dc.contributor.authorTakakura, K.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorOhyama, Hidenori
dc.date.accessioned2021-10-18T22:29:59Z
dc.date.available2021-10-18T22:29:59Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18106
dc.sourceIIOimport
dc.titleEvaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications - RASEDA
dc.source.conferencedate27/10/2010
dc.source.conferencelocationTakasaki Gunma Japan
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record