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Bandwidth analysis of functional interconnects used as test access mechanism

dc.contributor.authorVan den Berg, Ardy
dc.contributor.authorRen, Pengwei
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGaydadjiev, Georgi
dc.contributor.authorGoossens, Kees
dc.date.accessioned2021-10-18T22:51:51Z
dc.date.available2021-10-18T22:51:51Z
dc.date.issued2010-07
dc.identifier.issn0923-8174
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18155
dc.sourceIIOimport
dc.titleBandwidth analysis of functional interconnects used as test access mechanism
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage453
dc.source.endpage464
dc.source.journalJournal of Electronic Testing
dc.source.issue4
dc.source.volume26
dc.identifier.urlhttp://dx.doi.org/10.1007/s10836-010-5163-x
imec.availabilityPublished - imec


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