Bandwidth analysis of functional interconnects used as test access mechanism

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Authors

Van den Berg, Ardy; Ren, Pengwei; Marinissen, Erik Jan; Gaydadjiev, Georgi; Goossens, Kees

ISSN

0923-8174

Issue

4

Journal

Journal of Electronic Testing

Volume

26

Title

Bandwidth analysis of functional interconnects used as test access mechanism

Publication type

Journal article

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