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Bandwidth analysis of functional interconnects used as test access mechanism
Publication:
Bandwidth analysis of functional interconnects used as test access mechanism
Date
2010-07
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van den Berg, Ardy
;
Ren, Pengwei
;
Marinissen, Erik Jan
;
Gaydadjiev, Georgi
;
Goossens, Kees
Journal
Journal of Electronic Testing
Abstract
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1901
since deposited on 2021-10-18
Acq. date: 2025-10-30
Citations
Metrics
Views
1901
since deposited on 2021-10-18
Acq. date: 2025-10-30
Citations