Publication:

Bandwidth analysis of functional interconnects used as test access mechanism

Date

2010-07
Journal article
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dc.contributor.authorVan den Berg, Ardy
dc.contributor.authorRen, Pengwei
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGaydadjiev, Georgi
dc.contributor.authorGoossens, Kees
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2021-10-18T22:51:51Z
dc.date.available2021-10-18T22:51:51Z
dc.date.issued2010-07
dc.identifier.issn0923-8174
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18155
dc.identifier.urlhttp://dx.doi.org/10.1007/s10836-010-5163-x
dc.source.beginpage453
dc.source.endpage464
dc.source.issue4
dc.source.journalJournal of Electronic Testing
dc.source.volume26
dc.title

Bandwidth analysis of functional interconnects used as test access mechanism

dc.typeJournal article
dspace.entity.typePublication
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