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Physics and reliability of SONOS and TANOS devices

dc.contributor.authorVan den Bosch, Geert
dc.date.accessioned2021-10-18T22:52:14Z
dc.date.available2021-10-18T22:52:14Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18156
dc.sourceIIOimport
dc.titlePhysics and reliability of SONOS and TANOS devices
dc.typeOral presentation
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.conferenceInternational Memory Workshop, Tutorial on Charge Trap Memory
dc.source.conferencedate16/05/2010
dc.source.conferencelocationSeoul Korea
imec.availabilityPublished - imec


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