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Understanding the impact of metal gate on TANOS performance and retention
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Authors
Van den Bosch, Geert
;
Arreghini, Antonio
;
Breuil, Laurent
;
Cacciato, Antonio
;
Schram, Tom
;
Suhane, Amit
;
Zahid, Mohammed
;
Jurczak, Gosia
;
Van Houdt, Jan
Conference
IEEE International Memory Workshop - IMW
Title
Understanding the impact of metal gate on TANOS performance and retention
Publication type
Proceedings paper
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